일 | 월 | 화 | 수 | 목 | 금 | 토 |
---|---|---|---|---|---|---|
1 | 2 | |||||
3 | 4 | 5 | 6 | 7 | 8 | 9 |
10 | 11 | 12 | 13 | 14 | 15 | 16 |
17 | 18 | 19 | 20 | 21 | 22 | 23 |
24 | 25 | 26 | 27 | 28 | 29 | 30 |
- 리눅스
- 3분논문
- Photolithography
- 메타물질
- metasurface
- 과학
- Jackson Electrodynamics
- 자연 광자학
- 양자 플라즈몬
- nature photonics
- 초록빛논문
- 플라즈몬
- 그래프
- 논문
- Linux
- gnuplot
- 자연
- 겨울떨개
- 우분투
- 토막잭슨
- 학술지
- 전자기학
- TDDFT
- 물리학
- impact factor
- 광자학
- 메타표면
- octopus
- 나노포토닉스
- 자연 나노기술
- Today
- Total
과꾸로
[Photolithography] Spin-coating, baking, exposure and development conditions: AZ-series 본문
[Photolithography] Spin-coating, baking, exposure and development conditions: AZ-series
(gguro) 2016. 8. 8. 10:31[Photolithography] Spin-coating, baking, exposure and development conditions: AZ-series
One of the most commonly used photoresists is AZ 1500-series. Here, I make a note on spin-coating, baking, exposure and development conditions of AZ 1512 HS Photoresist.
Useful links:
Photoresist informaiton: http://www.microchemicals.com/products/photoresists/az_1512hs.html.
Data sheet (pdf): http://www.microchemicals.com/micro/az_1500_series.pdf
Exposure data (pdf): http://www.microchemicals.com/technical_information/exposure_photoresist.pdf
AZ 1512 HS Photoresist
1. Spin-coating
- Spin speed: 5770 rpm for 1.0 μm thickness
- Spin speed: 4000 rpm for 1.2 μm thickness
(Data from (pdf): http://www.microchemicals.com/micro/az_1500_series.pdf)
2. Baking
- Prebake: 100 ˚C, 50 seconds, hotplate
- Postexposure bake: Not required
(Data from (pdf): http://www.microchemicals.com/micro/az_1500_series.pdf)
3. Exposure
- Exposure: 15 seconds, (at intensity 20 mW/㎠)
- MA6 mask aligner intensity in July 2016: 10.3 mW/㎠ (365 nm), 19.3 mW/㎠ (400 nm)
(Exposure data (pdf): http://www.microchemicals.com/technical_information/exposure_photoresist.pdf)
(An integrated g-, h-, and i-line intensity of 20 mW/㎠)
4. Development
- Developer: AZ 400 K
- Dilution: 1:4 (1 AZ400K, 4 Water)
- Development: 2 minutes (immersion)
(Developer AZ400K data sheet (pdf): http://www.microchemicals.com/micro/az_400k_developer.pdf)
For most applications immersion for approximately 1 – 3 minutes in the high contrast makeup
is recommended. For thicker resist films, especially with AZ 4562, use about 30 seconds
per micron film thickness as a starting value. The developer bath should be maintained at
constant temperature (+/-1°C) within the range 20 – 25 °C. For less critical applications
immersion for approximately 60 seconds in the high-speed make-up is recommended, for
thick coatings time has to be prolonged as mentioned above. In all cases use mechanical
agitation with the motion in the plane of the wafers. Avoid vigorous agitation.
Rinse immediately in deionized water until resistivity is within specifications. Spin dry in air
or force dry with filtered nitrogen.
5. Postbake
- Postbake: 115 ˚C, 50 seconds, hotplate
6. Removal (after metal deposition)
- Remover: AZ 100 Remover
- Removal: 10 minutes immersion
- Sonication if required
8 Aug 2016
Coherent Harmonic Oscillator
겨울떨개
'연구자료' 카테고리의 다른 글
[Linux] 리눅스 VirtualBox Guest Additions 설치 (0) | 2016.09.23 |
---|---|
[파워포인트] 도형 복사해서 같은 자리에 놓기 (0) | 2016.08.30 |
[gnuplot] xticlabels - x축값. 숫자대신 글자. xtics in string (0) | 2016.08.08 |
[Photolithography] 실험방법, 주의사항 정리 (0) | 2016.07.25 |
NKT Super continuum laser 사용법 (0) | 2016.07.21 |